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Metrology Experts Focused on One Thing - You

Since 2012, Metrex has been providing Inspection and Metrology solutions for Applied Materials® platforms, delivering fully remanufactured systems, supporting customers with our extensive inventory of ready-to-ship spare parts, and delivering expert service and applications support worldwide.

Our Solutions

SYSTEMS

SEMVision Defect Review
VeritySEM Critical Dimension
WF | Compass | Complus Darkfield Inspection

SPARES

Over 60,000 parts in stock
Consumables and non-consumables
Legacy+Obsolesence upgrades
RS170 camera upgrade for all CD SEMS

SERVICE

Hardware and Application support
Level 5 FSE's
Flexible service support contracts
Size conversions + Chamber additions

TRAINING

Basic tool operation, equipment tasks, and troubleshooting
Advanced Applications for improved theoretical and operational knowledge

FOUNDRY

150-300mm wafers
Special Wafer thicknesses
Exotic materials
Calibration wafers

DEMO

State-of-the-art
Special Wafer thicknesses
Exotic materials
Calibration wafers

Our Focus

DEFECT REVIEW

Applied Materials®, Inc. has introduced the SEMVision DR-SEM system, a fully-automated defect review and classification scanning electron microscope specifically designed for in-line operation on advanced semiconductor production lines. The system uses several SEM imaging and material analysis techniques to improve chipmakers’ yield earning cycles during fab ramp-up and enables tighter yield control in volume production.

CRITICAL DIMENSION

The Applied Materials®, Inc. VeraSEM family of system’s exceptional in-line accuracy and process control eliminate more time-consuming and costly off-line wafer cross-sectioning while helping chipmakers to streamline process development, improve device performance and yield, and shorten ramp times to high-volume production.

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